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Journal of Applied Physics 91 (3): 1187-1190 (2002)

Structural phase transition in early growth of Bi2Sr 2CaCu2O8+x films on SrTiO3 substrates

M Abrecht , D Ariosa , M Onellion , G Margaritondo , D Pavuna
We used pulsed laser deposition, with a Bi2Sr 2CaCu2O8+x target, to grow films ranging from (1/4) to 10 unit cells thick. We studied these films, and reference Bi 2Sr2CaCu2O8+x single crystal samples, using angle-integrated photoemission, core level photoemission, and x-ray diffraction. The data indicate that all films exhibit a metallic-like Fermi edge in the photoemission data. More strikingly, a structural phase transition occurs at a nominal Bi2Sr2CaCu 2O8+x thickness of approximately one unit cell, converting the precursor Bi2O2.33 highly coherent thin film into a Bi2Sr2CaCu2O8+x structure. 2002 American Institute of Physics.
ISSN: 00218979     
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