Updated in 3/4/2011 12:23:44 PM      Viewed: 152 times      (Journal Article)
APPLIED OPTICS 48 (32): 6290-6295 (2009)

Edge enhancement for in-phase focal modulation microscope

Ke Si , Wei Gong , Nanguang Chen , Colin J R Sheppard
ABSTRACT
In-phase focal modulation microscopy (IPFMM) with single photon excited fluorescence is presented. Optical transfer functions and images of thin and thick fluorescent edges in IPFMM are investigated. The results show that, compared with confocal microscopy, using IPFMM can result in a sharper image of the edge, and the edge gradient can be increased up to 75.4% and 58.9% for a thick edge and a thin edge, respectively. Signal level is also discussed, and the results show that, to obtain high transverse resolution with IPFMM, the normalized detector pinhole radius should not exceed 2.8. (C) 2009 Optical Society of America
ISSN: 0003-6935